DC / RF Characterization

It is needed for collecting a significant amount of measured data from the several wafers over various temperatures by the devices for DC/CV and RF modeling. A conventional type of DC/CV measurement test cell comprises of a semi-automated prober having thermal chuck along with a DC analyzer along with a switch matrix when a probe card is used. For achieving higher throughput, some of the device modeling teams takes advantage of the Parametric Testers over conventional benchtop instruments. Conventionally in an RF test cell, a semi-automated prober is included along with a thermal chuck, apart from that there are Network Analyzer, and DC Analyzer or power supply. At each of the ports for combining RF and DC signals, Bias networks are used. For these RF test cells, the range of frequency can range from a few MHz to around 110GHz or even more.

BCL is a Technology Management Company having a futuristic outlook along with a prioritization of customer satisfaction. Keeping in mind the growing and diverse demands of the DC / RF Characterization industries of the region, we have brought in some of the best equipment from leaders of the world like SemiProbe, Fluxium, PET, and Eternal Sun.