Scanning Electron Microscope (SEM) is an advanced analytical tool that can go beyond the capabilities of a conventional light microscope. In a compound microscope, the basic array of magnifying lenses allows for sample magnification by around 1000x. Whereas in an advanced SEM the samples can be imaged with a resolution of 1nm or smaller. It is not only a viewing tool but also a complete analytical tool with various detector attachments to improve the topographic imaging and other analysis. The X-ray detectors, such as Energy dispersive X-ray spectroscopy (EDS) and Wavelength Dispersive Spectroscopy (WDS) will allow users to do elemental and compositional analysis down to parts per million (ppm) & parts per billion (ppb) respectively. With advent of new software technologies incorporated with SEM making it more advanced than before.

SEM is a preferred tool in educational institutes and universities, research areas of material science, solar, life science, health sciences, forensic, metal & mineral studies, nanotechnology, Pharma, chemical, oil & gas, composites, advanced materials etc.